Description
Micro-XRF and TXRF
Micro X-ray fluorescence spectrometry (Micro-XRF) is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small samples or even inclusions. Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
M4 TORNADO PLUS
M4 TORNADO PLUS
The world’s first Micro-XRF spectrometer that enables the detection and analysis of the entire element range from carbon to americium.
M4 TORNADO PLUS
Coating Analysis
Fast, accurate and non-destructive analysis of coatings and metallic multilayer stacks with Bruker’s tabletop Micro-XRF spectrometers.
Coating Analysis
S4 T-STAR
S4 T-STAR
Bruker’s new benchtop TXRF spectrometer for ultra-trace element analysis. The S4 T-STAR simplifies TXRF for 24/7 routine operation with guaranteed data quality.
S4 T-STAR
M4 TORNADO
WEBINARS: live and on-demand – Find out more about our products and a wide range of application fields
Webinars
M4 TORNADO AMICS
The ultra-fast high resolution elemental distribution analysis of the M4 TORNADO spectrometer with the powerful mineral identification and classification software AMICS.
M4 TORNADO AMICS
M1 MISTRAL
M1 MISTRAL
Compact tabletop Micro-XRF spectrometer for the analysis of bulk materials and coatings. Designed for fast and cost-efficient operation, it provides accurate information on the elemental composition of materials.
M1 MISTRAL
M6 JETSTREAM
ARTAX
ARTAX
The first commercially available portable Micro-XRF spectrometer designed for the spectroscopic analysis of unique and valuable objects on site.
ARTAX
S2 PICOFOX
S2 PICOFOX
The S2 PICOFOX is the most compact benchtop TXRF spectrometer for cost-efficient environmental analysis onsite.
S2 PICOFOX
ELIO
ELIO
The compact and portable X-ray fluorescence solution for reliable non-contact and non-destructive elemental analysis of valuable objects.
ELIO
CRONO
CRONO
The mobile and reconfigurable micro-XRF spectrometer for in-situ, non-destructive and high-speed examination of large objects.
